Theodore Manikas, Ph.D.

Theodore Manikas

Associate Chair of Computer Science
Clinical Professor of Computer Science

Office Location: 477 Caruth Hall

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Education

  • Ph.D. in Electrical Engineering, University of Pittsburgh

Biography

Theodore Manikas serves as the Associate Chair of the Computer Science Department at °ÄÃÅÁùºÏ²ÊÔ¤²â Lyle. His research interests include the application of optimization methods to computer system design, test, and security problems.   He has published over 60 refereed journal papers, book chapters, and conference papers.

Honors and Awards

  • Best Paper Award, IEEE North Atlantic Test Workshop, 2019

  • IEEE Excellence in Design and Test Engineering Award, IEEE North Atlantic Test Workshop, 2016

Research

  • Computer Architecture
  • Circuit Testing
  • Optimization Methods
  • Security

Recent Publications

  • E. Yassien, Y. Xu, H. Jiang, T. Nyugen, J. Dworak, T. Manikas, and K. Nepal, “Harvesting Wasted Clock Cycles for Efficient Online Testing”, 2023 IEEE European Test Symposium (ETS), Venezia, Italy, 2023, pp. 1-6, doi: 10.1109/ETS56758.2023.10173955.
  • H. Jiang, F. Zhang, J. Dworak, K. Nepal and T. Manikas, "Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift", Journal of Electronic Testing:  Theory and Applications (JETTA), 2023, 39(2), 227–243.
  • H. Jiang, J. Dworak, K. Nepal and T. Manikas, "Enhanced DFT for Fortuitous Detection of Transition Faults During Scan Shift," 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS), 2022, pp. 1-6, doi: 10.1109/MDTS54894.2022.9826976.
  • A. Sinha, M. Taylor, N. Srirama, T. Manikas, E. C. Larson and M. A. Thornton, "Industrial Control System Anomaly Detection Using Convolutional Neural Network Consensus," 2021 IEEE Conference on Control Technology and Applications (CCTA), 2021, pp. 693-700, doi: 10.1109/CCTA48906.2021.9659110.
  • Y. Sun, H. Jiang, L. Ramakrishnan, J. Dworak, K. Nepal, T. Manikas, R.I. Bahar, “Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits”, 2021 IEEE International Test Conference (ITC), pp. 319-323, doi: 10.1109/ITC50571.2021.00045.

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